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Multi-variable process data compression and defect isolation using wavelet PCA and genetic algorithm
Chaouch, Hanen, Najeh, Tawfik, Nabli, LotfiLanguage:
english
Journal:
The International Journal of Advanced Manufacturing Technology
DOI:
10.1007/s00170-016-9774-y
Date:
November, 2016
File:
PDF, 1.22 MB
english, 2016