Effect of ultrasound on reverse leakage current of silicon...

Effect of ultrasound on reverse leakage current of silicon Schottky barrier structure

Olikh, O. Ya, Voitenko, K. V., Burbelo, R. M., Olikh, Ja M.
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Volume:
37
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/37/12/122002
Date:
December, 2016
File:
PDF, 1.89 MB
english, 2016
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