Effect of ultrasound on reverse leakage current of silicon Schottky barrier structure
Olikh, O. Ya, Voitenko, K. V., Burbelo, R. M., Olikh, Ja M.Volume:
37
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/37/12/122002
Date:
December, 2016
File:
PDF, 1.89 MB
english, 2016