Total ionizing dose radiation effects on NMOS parasitic transistors in advanced bulk CMOS technology devices
He, Baoping, Wang, Zujun, Sheng, Jiangkun, Huang, ShaoyanVolume:
37
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/37/12/124003
Date:
December, 2016
File:
PDF, 756 KB
english, 2016