Device-independent dimension tests in the prepare-and-measure scenario
Sikora, Jamie, Varvitsiotis, Antonios, Wei, ZhaohuiVolume:
94
Language:
english
Journal:
Physical Review A
DOI:
10.1103/PhysRevA.94.042125
Date:
October, 2016
File:
PDF, 224 KB
english, 2016