[IEEE 2016 IEEE 34th International Conference on Computer Design (ICCD) - Scottsdale, AZ, USA (2016.10.2-2016.10.5)] 2016 IEEE 34th International Conference on Computer Design (ICCD) - Dynamic single and Dual Rail spin transfer torque look up tables with enhanced robustness under CMOS and MTJ process variations
Attaran, Aliyar, Salmani, Hassan, Homayoun, Houman, Mahmoodi, HamidYear:
2016
Language:
english
DOI:
10.1109/iccd.2016.7753300
File:
PDF, 387 KB
english, 2016