[IEEE 2016 IEEE Symposium on VLSI Circuits - Honolulu, HI, USA (2016.6.15-2016.6.17)] 2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits) - Versatile TLC NAND flash memory control to reduce read disturb errors by 85% and extend read cycles by 6.7-times of Read-Hot and Cold data for cloud data centers
Kobayashi, Atsuro, Tokutomi, Tsukasa, Takeuchi, KenYear:
2016
Language:
english
DOI:
10.1109/vlsic.2016.7573505
File:
PDF, 535 KB
english, 2016