[IEEE 2016 31st Symposium on Microelectronics Technology and Devices (SBMicro) - Belo Horizonte, Brazil (2016.8.29-2016.9.3)] 2016 31st Symposium on Microelectronics Technology and Devices (SBMicro) - n-Channel bulk and DTMOS FinFETs: Investigation of GIDL and gate leakage currents
Magan, Caio Malingre, Martino, Joao Antonio, Simoen, Eddy, Claeys, Cor, de Andrade, Maria Gloria CanoYear:
2016
Language:
english
DOI:
10.1109/sbmicro.2016.7731350
File:
PDF, 256 KB
english, 2016