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Understanding industrial safety: Comparing fault tree, Bayesian network, and FRAM approaches
Smith, Doug, Veitch, Brian, Khan, Faisal, Taylor, RockyLanguage:
english
Journal:
Journal of Loss Prevention in the Process Industries
DOI:
10.1016/j.jlp.2016.11.016
Date:
December, 2016
File:
PDF, 2.35 MB
english, 2016