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[IEEE 2016 IEEE 20th Workshop on Signal and Power Integrity (SPI) - Turin, Italy (2016.5.8-2016.5.11)] 2016 IEEE 20th Workshop on Signal and Power Integrity (SPI) - Eye-diagram estimation using equivalent circuit model of coupled microstrip channel on high-speed and wide I/O Channel for 2.5D and 3D IC
Choi, Sumin, Kim, Heegon, Jung, Daniel H., Kim, Jonghoon J., Lim, Jaemin, Lee, Hyunsuk, Cho, Kyungjun, Kim, JounghoYear:
2016
Language:
english
DOI:
10.1109/sapiw.2016.7496257
File:
PDF, 463 KB
english, 2016