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Investigation of Si Surface by Reflection High-Energy Electron Diffraction Using the Imaging Plate
Miura, Hiroshi, Ohtaka, Kouichi, Shindo, Daisuke, Oikawa, TetsuoVolume:
36
Year:
1995
Journal:
Materials Transactions, JIM
DOI:
10.2320/matertrans1989.36.1403
File:
PDF, 872 KB
1995