High etch-resistant EB resists employing adamantyl protective groups and their application for 248-nm lithography.
Nozaki, Koji, Kon, Jun-ichi, Yano, EiVolume:
13
Year:
2000
Language:
english
Journal:
Journal of Photopolymer Science and Technology
DOI:
10.2494/photopolymer.13.397
File:
PDF, 376 KB
english, 2000