Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films
Vilalta-Clemente, A., Naresh-Kumar, G., Nouf-Allehiani, M., Gamarra, P., di Forte-Poisson, M.A., Trager-Cowan, C., Wilkinson, A.J.Volume:
125
Language:
english
Journal:
Acta Materialia
DOI:
10.1016/j.actamat.2016.11.039
Date:
February, 2017
File:
PDF, 3.22 MB
english, 2017