Influence of void on image quality of industrial SPECT

Influence of void on image quality of industrial SPECT

Park, J G, Jung, S H, Kim, J B, Moon, J, Kim, C H
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Volume:
8
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/8/12/P12011
Date:
December, 2013
File:
PDF, 3.33 MB
english, 2013
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