Nano-Scale Characterization of Materials by Atom Probe...

Nano-Scale Characterization of Materials by Atom Probe Field Ion Microscopy.

Hono, Kazuhiro, Sakurai, Toshio
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Volume:
31
Year:
1992
Journal:
Bulletin of the Japan Institute of Metals
DOI:
10.2320/materia1962.31.900
File:
PDF, 16.62 MB
1992
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