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Structure Analysis of GaN Thin Film with Inversion Domains by High Voltage Atomic Resolution Microscopy
Iwamoto, Chihiro, Shen, Xu-Qiang, Okumura, Hajime, Matsuhata, Hirofumi, Ikuhara, YuuichiVolume:
43
Year:
2002
Language:
english
Journal:
MATERIALS TRANSACTIONS
DOI:
10.2320/matertrans.43.1542
File:
PDF, 440 KB
english, 2002