Microstructural Evolution of Nanoindented Ag/Si Thin-Film...

MATERIALS TRANSACTIONS 2011 Vol. 52; Iss. 10

Microstructural Evolution of Nanoindented Ag/Si Thin-Film under Different Annealing Temperatures

Lee, Woei-Shyan, Chen, Tao-Hsing, Lin, Chi-Feng, Wu, Cheng-Lun
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Volume:
52
Year:
2011
Language:
english
Journal:
MATERIALS TRANSACTIONS
DOI:
10.2320/matertrans.m2011160
File:
PDF, 7.98 MB
english, 2011
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