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Simulation of Transmission Electron Microscope Images of Dislocations Pinned by Obstacles
Satoh, Yuhki, Hatano, Takahiro, Nita, Nobuyasu, Nogiwa, Kimihiro, Matsui, HidekiVolume:
55
Year:
2014
Language:
english
Journal:
MATERIALS TRANSACTIONS
DOI:
10.2320/matertrans.md201312
File:
PDF, 908 KB
english, 2014