![](/img/cover-not-exists.png)
Fabrication of sub-100nm Patterns using Near-field Mask Lithography with Ultra-thin Resist Process
Ito, Toshiki, Ogino, Masaya, Yamanaka, Tomohiro, Inao, Yasuhisa, Yamaguchi, Takako, Mizutani, Natsuhiko, Kuroda, RyoVolume:
18
Year:
2005
Journal:
Journal of Photopolymer Science and Technology
DOI:
10.2494/photopolymer.18.435
File:
PDF, 735 KB
2005