Isotropic Evaluation of Streak Artifact Using Extreme Value Statistical Analysis
Nakane, Jun, Kobayashi, Yoshiharu, Shiozawa, TsutomuVolume:
71
Year:
2015
Journal:
Japanese Journal of Radiological Technology
DOI:
10.6009/jjrt.2015_jsrt_71.12.1165
File:
PDF, 5.49 MB
2015