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Time-resolved kelvin probe force microscopy to study population and depopulation of traps in electron or hole majority organic semiconductors
Moscatello, Jason P., Castaneda, Chloe V., Zaidi, Alyina, Cao, Minxuan, Usluer, Ozlem, Briseno, Alejandro L., Aidala, Katherine E.Volume:
41
Language:
english
Journal:
Organic Electronics
DOI:
10.1016/j.orgel.2016.11.001
Date:
February, 2017
File:
PDF, 1.07 MB
english, 2017