[IEEE 2016 IEEE/MTT-S International Microwave Symposium (IMS) - San Francisco, CA (2016.5.22-2016.5.27)] 2016 IEEE MTT-S International Microwave Symposium (IMS) - Field emission mitigation in X-band silicon-etched cavity resonators
Semnani, Abbas, Sinanis, Michael, Shaffer, Garrett, Peroulis, DimitriosYear:
2016
Language:
english
DOI:
10.1109/mwsym.2016.7540123
File:
PDF, 224 KB
english, 2016