Iso-Trapping Measurement Technique for Characterization of...

IEEE Transactions on Electron Devices 2017 / 1 Vol. 64; Iss. 1

Iso-Trapping Measurement Technique for Characterization of Self-Heating in a GaN HEMT

Albahrani, Sayed Ali, Parker, Anthony, Heimlich, Michael, Schwitter, Bryan
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Volume:
64
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2016.2628239
Date:
January, 2017
File:
PDF, 914 KB
english, 2017
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