Numerical Analysis for Electromigration of Cu Atom

Numerical Analysis for Electromigration of Cu Atom

Nemoto, Takenao, Murakawa, Tutomu, Yokobori, Jr., Toshimitsu A.
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Volume:
70
Year:
2006
Journal:
Journal of the Japan Institute of Metals
DOI:
10.2320/jinstmet.70.374
File:
PDF, 453 KB
2006
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