Numerical Analysis for Electromigration of Cu Atom
Nemoto, Takenao, Murakawa, Tutomu, Yokobori, Jr., Toshimitsu A.Volume:
70
Year:
2006
Journal:
Journal of the Japan Institute of Metals
DOI:
10.2320/jinstmet.70.374
File:
PDF, 453 KB
2006