Transient Creep in High-Purity Aluminum at Ultra-Low Strain Rate and Room Temperature by Constant Stress and Changing-Stress Experiments
Shen, Junjie, Ikeda, Ken-ichi, Hata, Satoshi, Nakashima, HideharuТом:
52
Рік:
2011
Мова:
english
Журнал:
MATERIALS TRANSACTIONS
DOI:
10.2320/matertrans.m2011175
Файл:
PDF, 570 KB
english, 2011