Specimen Fracturing Device for Ion Microprobe Mass Analyzer...

Specimen Fracturing Device for Ion Microprobe Mass Analyzer and its Application to the Analysis of Grain Boundary Segregation

Sato, Kimitaka, Suzuki, Ken&rsquo, ichi, Matsumoto, Ryutaro, Nagashima, Shin&rsquo, ichi
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Volume:
18
Year:
1977
Language:
english
Journal:
Transactions of the Japan Institute of Metals
DOI:
10.2320/matertrans1960.18.61
File:
PDF, 8.26 MB
english, 1977
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