Application of VEMA type ArF Resist to Sub-100nm Lithography.
Kim, Hyun-Woo, Lee, Sook, Choi, Sang-Jun, Woo, Sang-Gyun, Chae, Yun-Sook, Kim, Jisoo, Moon, Joo-Tae, Kavanagh, Robert, Barclay, GeorgeVolume:
15
Year:
2002
Language:
english
Journal:
Journal of Photopolymer Science and Technology
DOI:
10.2494/photopolymer.15.529
File:
PDF, 1.00 MB
english, 2002