Lattice imaging study of in-depth disordering of...

Applied Physics A: Materials Science & Processing 1988 / 07 Vol. 46; Iss. 3

Lattice imaging study of in-depth disordering of Si-implanted GaAs

G. Vitali, M. Kalitzova, N. Pashov, P. Werner, H. Bartsch, D. Karpuzov
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Volume:
46
Language:
english
Pages:
6
DOI:
10.1007/bf00939262
Date:
July, 1988
File:
PDF, 1.36 MB
english, 1988
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