Total Ionizing Dose, Random Dopant Fluctuations, and its...

Microelectronics Reliability 2017 / 01 Vol. 68

Total Ionizing Dose, Random Dopant Fluctuations, and its combined effect in the 45nm PDSOI node

Chatzikyriakou, Eleni, Redman-White, William, Groot, C.H. De
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Volume:
68
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2016.11.007
Date:
January, 2017
File:
PDF, 2.67 MB
english, 2017
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