Using Similarity Metrics to Quantify Differences in...

ACS Combinatorial Science 2017 / 01 Vol. 19; Iss. 1

Using Similarity Metrics to Quantify Differences in High-Throughput Data Sets: Application to X-ray Diffraction Patterns

Hernández-Rivera, Efraín, Coleman, Shawn P., Tschopp, Mark A.
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Volume:
19
Language:
english
Journal:
ACS Combinatorial Science
DOI:
10.1021/acscombsci.6b00142
Date:
January, 2017
File:
PDF, 2.26 MB
english, 2017
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