[IEEE 2016 International Conference on Electrical, Electronics, and Optimization Techniques (ICEEOT) - Chennai, India (2016.3.3-2016.3.5)] 2016 International Conference on Electrical, Electronics, and Optimization Techniques (ICEEOT) - Comparative risk analysis on prediction of Diabetes Mellitus using machine learning approach
Swain, Aparimita, Mohanty, Sachi Nandan, Das, Ananta ChandraYear:
2016
Language:
english
DOI:
10.1109/iceeot.2016.7755319
File:
PDF, 612 KB
english, 2016