[IEEE 2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO) - Sendai, Japan (2016.8.22-2016.8.25)] 2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO) - Piezoresistive cantilever for measuring mass of airborne particles
Chen, Sheng-Jui, Lin, Yen-Liang, Wu, Chung-LinYear:
2016
Language:
english
DOI:
10.1109/nano.2016.7751463
File:
PDF, 311 KB
english, 2016