Numerical Analyses for Contact Resistance due to...

IEICE Transactions on Electronics 2010 Vol. E93-C; Iss. 6

Numerical Analyses for Contact Resistance due to Constriction Effect of Current Flowing through Multi-Spot Construction

SAWADA, Shigeru, TAMAI, Terutaka, HATTORI, Yasuhiro, IIDA, Kazuo
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Volume:
E93-C
Year:
2010
Language:
english
Journal:
IEICE Transactions on Electronics
DOI:
10.1587/transele.e93.c.905
File:
PDF, 9.38 MB
english, 2010
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