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Efficient Method to Measure IMD of Power Amplifier with Simplified Phase Determination Procedure to Clarify Memory Effect Origins
TAKANO, Takeshi, OHISHI, Yasuyuki, KIMURA, Shigekazu, NAKAMURA, Michiharu, NAGATANI, Kazuo, FUKUDA, Eisuke, DAIDO, Yoshimasa, ARAKI, KiyomichiVolume:
E93-C
Year:
2010
Language:
english
Journal:
IEICE Transactions on Electronics
DOI:
10.1587/transele.e93.c.991
File:
PDF, 2.16 MB
english, 2010