Profilometry of thin films on rough substrates by Raman...

Scientific Reports 2016 / 12 Vol. 6; Iss. 1

Profilometry of thin films on rough substrates by Raman spectroscopy

Ledinský, Martin, Paviet-Salomon, Bertrand, Vetushka, Aliaksei, Geissbühler, Jonas, Tomasi, Andrea, Despeisse, Matthieu, De Wolf , Stefaan, Ballif , Christophe, Fejfar, Antonín
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Volume:
6
Language:
english
Journal:
Scientific Reports
DOI:
10.1038/srep37859
Date:
December, 2016
File:
PDF, 631 KB
english, 2016
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