![](/img/cover-not-exists.png)
[IEEE 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) - Ottawa, ON, Canada (2016.7.10-2016.7.15)] 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) - Study of contact resistance in connectors with physical simulation using nano-fabrication
Fukuyama, Yasuhiro, Sakamoto, Norihiko, Kondo, Takaya, Onuma, Masanori, Kaneko, Nobu-HisaYear:
2016
Language:
english
DOI:
10.1109/cpem.2016.7540591
File:
PDF, 265 KB
english, 2016