Suppression of Edge Effects Based on Analytic Model for...

IEICE Transactions on Electronics 2010 Vol. E93-C; Iss. 5

Suppression of Edge Effects Based on Analytic Model for Leakage Current Reduction of Sub-40nm DRAM Device

CHOI, Soo Han, PARK, Young Hee, PARK, Chul Hong, LEE, Sang Hoon, YOO, Moon Hyun, CHO, Jun Dong, KIM, Gyu Tae
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Volume:
E93-C
Year:
2010
Language:
english
Journal:
IEICE Transactions on Electronics
DOI:
10.1587/transele.e93.c.658
File:
PDF, 2.58 MB
english, 2010
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