The distributed thermal model of fin field effect...

Microelectronics Reliability 2016 / 12 Vol. 67

The distributed thermal model of fin field effect transistor

Zubert, Mariusz, Raszkowski, Tomasz, Samson, Agnieszka, Janicki, Marcin, Napieralski, Andrzej
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Volume:
67
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2016.09.021
Date:
December, 2016
File:
PDF, 1.07 MB
english, 2016
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