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[IEEE 2016 11th European Microwave Integrated Circuits Conference (EuMIC) - London, United Kingdom (2016.10.3-2016.10.4)] 2016 11th European Microwave Integrated Circuits Conference (EuMIC) - Linearity characterization of GaN HEMT technologies through innovative on-wafer multi-tone load-pull measurements
Kahil, Si Abed Karim, Laurent, Sylvain, Quere, Raymond, Sombrin, Jacques, Floriot, Didier, Brunel, Valeria, Teyssandier, CharlesYear:
2016
Language:
english
DOI:
10.1109/EuMIC.2016.7777483
File:
PDF, 659 KB
english, 2016