On-wafer noise parameters measurement using an extended...

International Journal of Microwave and Wireless Technologies 2017 / 05 Vol. 9; Iss. 4

On-wafer noise parameters measurement using an extended six-port network and conventional noise figure analyzer

Ahmed, Abdul-Rahman, Lee, Dong-Hyun, Yeom, Kyung-Whan
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Volume:
9
Language:
english
Journal:
International Journal of Microwave and Wireless Technologies
DOI:
10.1017/s1759078716000842
Date:
May, 2017
File:
PDF, 665 KB
english, 2017
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