Reordering Tests for Efficient Fail Data Collection and...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2017 / 4 Vol. 25; Iss. 4

Reordering Tests for Efficient Fail Data Collection and Tester Time Reduction

Bodhe, Shraddha, Pomeranz, Irith, Amyeen, M. Enamul, Venkataraman, Srikanth
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Volume:
25
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2016.2628321
Date:
April, 2017
File:
PDF, 2.75 MB
english, 2017
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