Impact of dual field plates on drain current degradation in...

Semiconductor Science and Technology 2016 / 12 Vol. 31; Iss. 12

Impact of dual field plates on drain current degradation in InAlN/AlN/GaN HEMTs

Li, Wei, Wang, Quan, Zhan, Xiangmi, Yan, Junda, Jiang, Lijuan, Yin, Haibo, Gong, Jiamin, Wang, Xiaoliang, Liu, Fengqi, Li, Baiquan, Wang, Zhanguo
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Volume:
31
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/31/12/125003
Date:
December, 2016
File:
PDF, 1.86 MB
english, 2016
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