[IEEE 2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO) - Sendai, Japan (2016.8.22-2016.8.25)] 2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO) - Effects of work-function variation on analog figures-of-merits of inversion-mode and junctionless nanowire transistors
Kim, Jiwon, Oh, Hyeongwan, Kim, Jungsik, Lee, Jeong-SooYear:
2016
Language:
english
DOI:
10.1109/nano.2016.7751522
File:
PDF, 270 KB
english, 2016