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[IEEE 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2016.7.18-2016.7.21)] 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - From IC debug to hardware security risk: The power of backside access and optical interaction
Boit, C., Tajik, S., Scholz, P., Amini, E., Beyreuther, A., Lohrke, H., Seifert, J. P.Year:
2016
Language:
english
DOI:
10.1109/ipfa.2016.7564318
File:
PDF, 487 KB
english, 2016