Full information acquisition and analysis of reflection...

Full information acquisition and analysis of reflection high energy electron diffraction data for epitaxial growth processes

Vasudevan, R. K., Gianfrancesco, A. G., Baddorf, A. P., Kalinin, S. V.
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Volume:
22
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927616002737
Date:
July, 2016
File:
PDF, 429 KB
english, 2016
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