Growth and In Situ Characterization of Oxide Epitaxial Heterostructures with Atomic Plane Precision
He, Q., Jesse, S., Lupini, A.R., Fuentes-Cabrera, M., Sumpter, B.G., Akbashev, A., Falmbigl, M., Spanier, J., Kalinin, S. V., Borisevich, A.Y.Volume:
22
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927616008369
Date:
July, 2016
File:
PDF, 913 KB
english, 2016