Why Do We Need to Use Three-Dimensional (3D) Fourier Transform (FT) Analysis to Evaluate a High-Performance Transmission Electron Microscope (TEM)?
Ishizuka, Kazuo, Kimoto, KojiVolume:
22
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927616011806
Date:
October, 2016
File:
PDF, 643 KB
english, 2016