Current-limiting challenges for all-spin logic devices
Su, Li, Zhang, Youguang, Klein, Jacques-Olivier, Zhang, Yue, Bournel, Arnaud, Fert, Albert, Zhao, WeishengVolume:
5
Language:
english
Journal:
Scientific Reports
DOI:
10.1038/srep14905
Date:
October, 2015
File:
PDF, 3.09 MB
english, 2015