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[IEEE 2016 IEEE International Workshop on Signal Processing Systems (SiPS) - Dallas, TX, USA (2016.10.26-2016.10.28)] 2016 IEEE International Workshop on Signal Processing Systems (SiPS) - Xor-Masking: A Novel Statistical Method for Instruction Read Energy Reduction in Contemporary SRAM Technologies
Multanen, Joonas, Viitanen, Timo, Jaaskelainen, Pekka, Takala, JarmoYear:
2016
Language:
english
DOI:
10.1109/SiPS.2016.19
File:
PDF, 558 KB
english, 2016