Single Event Upset Sensitivity of D-Flip Flop: Comparison...

IEEE Transactions on Nuclear Science 2017 / 1 Vol. 64; Iss. 1

Single Event Upset Sensitivity of D-Flip Flop: Comparison of PDSOI With Bulk Si at 130 nm Technology Node

Zhang, Leqing, Xu, Jialing, Fan, Shuang, Dai, Lihua, Bi, Dawei, Lu, Jian, Hu, Zhiyuan, Zhang, Mengying, Zhang, Zhengxuan
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Volume:
64
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2016.2636338
Date:
January, 2017
File:
PDF, 790 KB
english, 2017
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