Effects of Threshold Voltage Variations on Single-Event...

IEEE Transactions on Nuclear Science 2017 / 1 Vol. 64; Iss. 1

Effects of Threshold Voltage Variations on Single-Event Upset Response of Sequential Circuits at Advanced Technology Nodes

Zhang, Hangfang, Jiang, Hui, Assis, Thiago R., Mahatme, Nihaar N., Narasimham, Balaji, Massengill, Lloyd W., Bhuva, Bharat L., Wen, Shi-Jie, Wong, Richard
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Volume:
64
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2016.2637873
Date:
January, 2017
File:
PDF, 793 KB
english, 2017
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